Effect of Cu contamination on electrical characteristics for PMOS transistors

by Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Chan, L., See, A.K.
Published 2014

Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETs

by Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Cha, C.L., Chan, L., See, A.K.
Published 2014

Uniform void-free epitaxial CoSi 2 formation on STI bounded narrow Si(lOO) lines by template layer stress reduction

by Ho, C.S., Pey, K.L., Tung, C.H., Zhang, B.C., Tee, K.C., Karunasiri, G., Chua, S.J.
Published 2014

Laser-induced formation of titanium silicides

by Chen, S.Y., Shen, Z.X., Chen, Z.D., See, A.K., Chan, L.H., Zhang, T.J., Tee, K.C.
Published 2014

SDODEL MOSFET for performance enhancement

by Chui, K.J., Samudra, G.S., Yeo, Y.-C., Tee, K.-C., Leong, K.-W., Tee, K.M., Benistant, F., Chan, L.
Published 2014

Effect of processing parameters on electroless Cu seed layer properties

by Chen, Z., Chan, L., See, Alex K. H., Law, S. B., Zeng, K. Y., Shen, L., Tee, K. C., Ee, Elden Yong Chiang
Published 2012

Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

by Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O.
Published 2014

Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formation

by Ho, C.S., Pey, K.L., Tung, C.H., Tee, K.C., Prasad, K., Saigal, D., Tan, J.J.L., Wong, H., Lee, K.H., Osipowicz, T., Chua, S.J., Karunasiri, R.P.G.
Published 2014