Local current measurements for avalanche breakdown in Silicon p-n junctions

by Poenar, Daniel P., Ding, Y., Isakov, D. V.
Published 2013

Optical near-field probe with embedded gallium scattering center

by Isakov, D.V., Zhang, Y., Balk, L.J., Phang, J.C.H.
Published 2014

Scanning near-field photon emission microscopy

by Isakov, D., Geinzer, T., Tio, A., Phang, J.C.H., Zhang, Y., Balk, L.J.
Published 2014

Applications of scanning Near-field photon emission microscopy

by Isakov, D., Tan, B., Phang, J., Yeo, Y., Tio, A., Zhang, Y., Geinzer, T., Balk, L.
Published 2014

Near-field detection of photon emission from silicon with 30 nm spatial resolution

by Isakov, D., Tio, A.A.B., Geinzer, T., Phang, J.C.H., Zhang, Y., Balk, L.J.
Published 2014

A general simulation procedure for the electrical characteristics of metal-insulator-semiconductor tunnel structures

by Vexler, M. I., Tyaginov, S. E., Illarionov, Yu. Yu., Sing, Yew Kwang., Shenp, Ang Diing., Fedorov, V. V., Isakov, D. V.
Published 2013

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

by Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
Published 2014

Applications of scanning near-field photon emission microscopy

by Isakov, D.V., Tan, B.W.M., Phang, J.C.H., Yeo, Y.C., Tio, A.A.B., Zhang, Y., Geinzer, T., Balk, L.J.
Published 2014

Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

by Tan, S.L., Ang, K.W., Toh, K.H., Isakov, D., Chua, C.M., Koh, L.S., Yeo, Y.C., Chan, D.S.H., Phang, J.C.H.
Published 2014