Investigation of capacitive coupling voltage contrast using a specimen charging model

由 Sim, K., Chan, D., Phang, J.
出版 2014

A review of curve fitting error criteria for solar cell I-V characteristics

由 Phang, J.C.H., Chan, D.S.H.
出版 2014

A portable scanning electron microscope column design based on the use of permanent magnets

由 Khursheed, A., Phang, J.C., Thong, J.T.L.
出版 2014

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

由 Kolachina, S., Phang, J.C.H., Chan, D.S.H.
出版 2014

Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester

由 Phang, J.C.H., Sim, K.S., Chan, D.S.H.
出版 2014

Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester

由 Sim, K.S., Phang, J.C.H., Chan, D.S.H.
出版 2014

Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images

由 Sim, K.S., Thong, J.T.L., Phang, J.C.H.
出版 2014

Automatic DRAM cell location in the SEM

由 Thong, J.T.L., Zhu, Y., Phang, J.C.H.
出版 2014

Single-image signal-to-noise ratio estimation

由 Thong, J.T.L., Sim, K.S., Phang, J.C.H.
出版 2014

Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy

由 Meng, L., Street, A.G., Phang, J.C.H.
出版 2014

A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

由 Ong, V.K.S., Phang, J.C.H., Chan, D.S.H.
出版 2014

Charging identification and compensation in the scanning electron microscope

由 Wong, W.K., Thong, J.T.L., Phang, J.C.H.
出版 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved technique

由 Ong, K.H., Phang, J.C.H., Thong, J.T.L.
出版 2014

A novel method for the discharge of electrostatic mirror formations in the scanning electron microscope

由 Wong, W.K., Phang, J.C.H., Thong, J.T.L.
出版 2014

Determination of the local electric field strength near electric breakdown

由 Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
出版 2014

Charging control using pulsed scanning electron microscopy

由 Wong, W.K., Phang, J.C.H., Thong, J.T.L.
出版 2014

Determination of the local electric field strength by energy dispersive Photon Emission Microscopy

由 Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
出版 2014

Automatic IC Die Positioning in the SEM

由 Tan, H.W., Phang, J.C.H., Thong, J.T.L.
出版 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing method

由 Ong, K.H., Phang, J.C.H., Thong, J.T.L.
出版 2014

Determination of secondary electron yield from insulators due to a low-kV electron beam

由 Yong, Y.C., Thong, J.T.L., Phang, J.C.H.
出版 2014