Backside reflectance modulation of microscale metal interconnects

由 Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
出版 2014

N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques

由 Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
出版 2014

Characterization of MOS transistors using dynamic backside reflectance modulation technique

由 Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
出版 2014

Negative backside thermoreflectance modulation of microscale metal interconnects

由 Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
出版 2014

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

由 Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
出版 2014