A review of curve fitting error criteria for solar cell I-V characteristics

بواسطة Phang, J.C.H., Chan, D.S.H.
منشور في 2014

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

بواسطة Kolachina, S., Phang, J.C.H., Chan, D.S.H.
منشور في 2014

Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester

بواسطة Phang, J.C.H., Sim, K.S., Chan, D.S.H.
منشور في 2014

Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester

بواسطة Sim, K.S., Phang, J.C.H., Chan, D.S.H.
منشور في 2014

Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images

بواسطة Sim, K.S., Thong, J.T.L., Phang, J.C.H.
منشور في 2014

Automatic DRAM cell location in the SEM

بواسطة Thong, J.T.L., Zhu, Y., Phang, J.C.H.
منشور في 2014

Single-image signal-to-noise ratio estimation

بواسطة Thong, J.T.L., Sim, K.S., Phang, J.C.H.
منشور في 2014

Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy

بواسطة Meng, L., Street, A.G., Phang, J.C.H.
منشور في 2014

A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

بواسطة Ong, V.K.S., Phang, J.C.H., Chan, D.S.H.
منشور في 2014

Charging identification and compensation in the scanning electron microscope

بواسطة Wong, W.K., Thong, J.T.L., Phang, J.C.H.
منشور في 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved technique

بواسطة Ong, K.H., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

A novel method for the discharge of electrostatic mirror formations in the scanning electron microscope

بواسطة Wong, W.K., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

Determination of the local electric field strength near electric breakdown

بواسطة Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
منشور في 2014

Charging control using pulsed scanning electron microscopy

بواسطة Wong, W.K., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

Determination of the local electric field strength by energy dispersive Photon Emission Microscopy

بواسطة Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
منشور في 2014

Automatic IC Die Positioning in the SEM

بواسطة Tan, H.W., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing method

بواسطة Ong, K.H., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

Determination of secondary electron yield from insulators due to a low-kV electron beam

بواسطة Yong, Y.C., Thong, J.T.L., Phang, J.C.H.
منشور في 2014

A robust focusing and astigmatism correction method for the scanning electron microscope

بواسطة Ong, K.H., Phang, J.C.H., Thong, J.T.L.
منشور في 2014

Imaging of charging specimens at high beam energies in the SEM

بواسطة Wong, W.K., Phang, J.C.H., Thong, J.T.L.
منشور في 2014