Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

• Main Authors: Ho, Y.W., Ng, V., Choi, W.K., Ng, S.P., Osipowicz, T., Seng, H.L., Tjui, W.W., Li, K.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Germanium; Nanocrystal; Raman spectroscopy; Rutherford backscattering; Transmission electron microscopy
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/82035

10.1016/S1359-6462(01)00743-6