Circuit model of elastomer probe for fine pitch wafer level package test applications

Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005

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書目詳細資料
Main Authors: Jayabalan, J., Ooi, B.L., Leong, M.S., Iyer, M.K.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/69603
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