Two-wavelength microscopic speckle interferometry using colour CCD camera

• Main Authors: Upputuri, Paul K., Pramanik, Manojit, Kothiyal, Mahendra Prasad, Nandigana, Krishna Mohan
• 其他作者: School of Chemical and Biomedical Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2015
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
• 在線閱讀: https://hdl.handle.net/10356/106900; http://hdl.handle.net/10220/25212

Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the overcrowding of fringes and it cannot provide shape o...