White light interferometry for surface profiling with a colour CCD

• Main Authors: Kumar, U.P., Haifeng, W., Mohan, N.K., Kothiyal, M.P.
• 其他作者: PHYSICS
• 格式: Article
• 出版: 2014
• 主題: Fringe analysis; Phase shifting; Single-chip colour CCD camera; Surface profiling; White light interferometry
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/98582
• 機構: National University of Singapore

10.1016/j.optlaseng.2012.02.002