Direct writing of channels for microfluidics in silica by MeV ion beam lithography
The lithographic exposure characteristic of amorphous silica (SiO 2) was investigated for 6.8 MeV 16O3+ ions. A programmable proximity aperture lithography (PPAL) technique was used for the ion beam exposure. After exposure, the exposed pattern was developed by selective etching in 4% v/v HF. Here,...
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Main Authors: | , , , , , , , |
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格式: | Conference or Workshop Item |
語言: | English |
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2014
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在線閱讀: | http://www.scopus.com/inward/record.url?eid=2-s2.0-79960058706&partnerID=40&md5=c38a6e7a4f8f01c7c8b4087193beba01 http://cmuir.cmu.ac.th/handle/6653943832/6521 |
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