Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy

Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy

10.1063/1.1474597

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書目詳細資料
Main Authors:	Seng, H.L., Osipowicz, T., Sum, T.C., Tok, E.S., Breton, G., Woods, N.J., Zhang, J.
其他作者:	PHYSICS
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/97618
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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