Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
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sg-nus-scholar.10635-726762024-11-08T18:01:38Z Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements Goh, Y.H. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 23-27 00267 2014-06-19T05:10:45Z 2014-06-19T05:10:45Z 1997 Conference Paper Goh, Y.H.,Ling, C.H. (1997). Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 23-27. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72676 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
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NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Goh, Y.H. Ling, C.H. |
| format |
Conference or Workshop Item |
| author |
Goh, Y.H. Ling, C.H. |
| spellingShingle |
Goh, Y.H. Ling, C.H. Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| author_sort |
Goh, Y.H. |
| title |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| title_short |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| title_full |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| title_fullStr |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| title_full_unstemmed |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
| title_sort |
hot carrier degradation study in pmosfet using gated-diode drain current and charge pumping measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72676 |
| _version_ |
1821212016148217856 |