Impact of metal gate work function on nano CMOS device performance

International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

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書目詳細資料
Main Authors: Hou, Y.T., Low, T., Xu, B., Li, M.-F., Samudra, G., Kwong, D.L.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/70537
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機構: National University of Singapore