Circular apertures for contact hole patterning in 193 nm immersion lithography
10.1116/1.3546100
Saved in:
Main Authors: | Tay, C.J., Quan, C., Ling, M.L., Chua, G.S., Tan, S.K., Lin, Q. |
---|---|
其他作者: | MECHANICAL ENGINEERING |
格式: | Article |
出版: |
2014
|
在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/59709 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | National University of Singapore |
相似書籍
-
Circular apertures for contact hole patterning in 193nm immersion lithography
由: Tay, C.J., et al.
出版: (2014) -
Effect of process related and haze defects on 193 nm immersion lithography
由: Tay, C.J., et al.
出版: (2014) -
A comparative study for mask defect tolerance on phase and transmission for dry and immersion 193-nm lithography
由: Ling, M.L., et al.
出版: (2014) -
Customized illumination shapes for 193nm immersion lithography
由: Moh, L.L., et al.
出版: (2014) -
Modified Rayleigh criterion for 90 nm lithography technologies and below
由: Chua, G.S., et al.
出版: (2014)