Pulsed laser induced silicidation on TiN-capped Co/Si bilayers
This paper studies the effects of pulsed laser-induced annealing of TiN-capped Co/Si bilayers with and without preamorphized Si substrate. For a low fluence of 0.2 J /cm2, nonstoichiometry Co silicide with triple-layered structure is formed. On the other hand, highly textured CoSi2 gra...
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Main Authors: | , , , , , , |
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格式: | Article |
語言: | English |
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2012
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在線閱讀: | https://hdl.handle.net/10356/95012 http://hdl.handle.net/10220/8022 |
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