Formation and thermal stability of nickel germanide on germanium substrate

بواسطة Zhang, Q., Nan, W.U., Osipowicz, T., Bera, L.K., Zhu, C.
منشور في 2014

Channel mobility degradation and charge trapping in high-k/metal gate NMOSFETs

بواسطة Mathew, S., Bera, L.K., Balasubramanian, N., Joo, M.S., Cho, B.J.
منشور في 2014

Structural characterisation of polycrystalline SiGe thin film

بواسطة Teh, L.K., Choi, W.K., Bera, L.K., Chim, W.K.
منشور في 2014

Effects of nitric-oxide-plasma treatment on the electrical properties of tetraethylorthosilicate-deposited silicon dioxides on strained-Si1-xGex layers

بواسطة Senapati, B., Samanta, S.K., Maikap, S., Bera, L.K., Maiti, C.K.
منشور في 2014

Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin films

بواسطة Natarajan, A., Bera, L.K., Choi, W.K., Osipowicz, T., Seng, H.L.
منشور في 2014

Effects of thermal annealing on the electrical properties of tetraethylorthosilicate-based oxynitride films deposited on strained-Si1-xGex

بواسطة Samanta, S.K., Bera, L.K., Benerjee, H.D., Maiti, C.K.
منشور في 2014

Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1-x-y GexCy films

بواسطة Feng, W., Choi, W.K., Bera, L.K., Ji, M., Yang, C.Y.
منشور في 2014

Rapid thermal oxidation of radio frequency sputtered polycrystalline silicon germanium films

بواسطة Choi, W.K., Natarajan, A., Bera, L.K., Wee, A.T.S., Liu, Y.J.
منشور في 2014

Gate dielectrics on strained-Si/SiGe heterolayers

بواسطة Maiti, C.K., Samanta, S.K., Chatterjee, S., Dalapati, G.K., Bera, L.K.
منشور في 2014

Electrical properties of rapid thermal oxides on Si1-x-yGexCy films

بواسطة Bera, L.K., Choi, W.K., Feng, W., Yang, C.Y., Mi, J.
منشور في 2014

Effect of post-oxidation annealing on the electrical properties of deposited oxide and oxynitride films on strained-Si0.82Ge0.18 layers

بواسطة Samanta, S.K., Maikap, S., Bera, L.K., Banerjee, H.D., Maiti, C.K.
منشور في 2014

C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys

بواسطة Feng, W., Choi, W.K., Bera, L.K., Mi, J., Yang, C.Y.
منشور في 2014

Spectroscopic ellipsometry and electrical studies of as-grown and rapid thermal oxidized Si1-x-yGexCy films

بواسطة Choi, W.K., Feng, W., Bera, L.K., Yang, C.Y., Mi, J.
منشور في 2014

High quality gate dielectrics grown by rapid thermal processing using split-N 2O technique on strained-Si 0.91Ge 0.09 films

بواسطة Bera, L.K., Choi, W.K., Tan, C.S., Samanta, S.K., Maiti, C.K.
منشور في 2014

Interface properties and reliability of ultrathin oxynitride films grown on strained Si1-xGex substrates

بواسطة Samanta, S.K., Chatterjee, S., Maikap, S., Bera, L.K., Banerjee, H.D., Maiti, C.K.
منشور في 2014

Tungsten nanocrystals embedded in high- k materials for memory application

بواسطة Samanta, S.K., Yoo, W.J., Samudra, G., Tok, E.S., Bera, L.K., Balasubramanian, N.
منشور في 2014

Drive-current enhancement in Ge n-Channel MOSFET using laser annealing for source/drain activation

بواسطة Zhang, Q., Huang, J., Wu, N., Chen, G., Hong, M., Bera, L.K., Zhu, C.
منشور في 2014

Wet etching characteristics and surface morphology evaluation of MOCVD grown HfO2 film

بواسطة Balasubramanian, M., Bera, L.K., Mathew, S., Balasubramanian, N., Lim, V., Joo, M.S., Cho, B.J.
منشور في 2014

Germanium incorporation in Hf O2 dielectric on germanium substrate

بواسطة Zhang, Q., Wu, N., Lai, D.M.Y., Nikolai, Y., Bera, L.K., Zhu, C.
منشور في 2014

Structural and electrical characterizations of oxynitride films on solid phase epitaxially grown silicon carbide

بواسطة Bera, L.K., Choi, W.K., McNeill, D., Ray, S.K., Chatterjee, S., Maiti, C.K.
منشور في 2014