On the transient amorphous silicon structures during solid phase crystallization

• Main Authors: Law, F., Hidayat, H., Kumar, A., Widenborg, P., Luther, J., Hoex, B.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Amorphous silicon; Fourier transform infrared spectroscopy; In-situ X-ray diffraction; Keywords; Raman spectroscopy; Solid phase crystallization
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/86607

10.1016/j.jnoncrysol.2012.12.034