Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors
10.1109/RELPHY.2007.369569
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| Main Authors: | , , , , , , , |
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| 其他作者: | |
| 格式: | Conference or Workshop Item |
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2014
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| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/83804 |
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| 機構: | National University of Singapore |