Characterization of ultrashallow dopant profiles using spreading resistance profiling

10.1116/1.1426370

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書目詳細資料
Main Authors: Tan, L.S., Tan, L.C.P., Leong, M.S., Mazur, R.G., Ye, C.W.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/83545
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