APA استشهاد

Li, M., Wang, X., Shen, C., Yang, J., Chen, J., Yu, H., . . . ENGINEERING, E. &. C. (2014). Some issues in advanced CMOS gate stack performance and reliability.

استشهاد بنمط شيكاغو

Li, M.-F., X.P Wang, C. Shen, J.J Yang, J.D Chen, H.Y Yu, C. Zhu, D. Huang, و ELECTRICAL & COMPUTER ENGINEERING. Some Issues in Advanced CMOS Gate Stack Performance and Reliability. 2014.

MLA استشهاد

Li, M.-F., et al. Some Issues in Advanced CMOS Gate Stack Performance and Reliability. 2014.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.