Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

10.1002/pssr.201105537

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書目詳細資料
Main Authors:	Piramanayagam, S.N., Ranjbar, M., Sbiaa, R., Tavakkoli K.G.A., Chong, T.C.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Article
出版:	2014
主題:	Bit-patterned media Magnetic force microscopy Nanostructures Perpendicular magnetic anisotropy
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/82041
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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