導出完成 — 

High frequency characterization of 100 micron pitch wafer level package interconnects

Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005

Saved in:
書目詳細資料
Main Authors: Jayabalan, J., Rotaru, M.D.
其他作者: MECHANICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/73503
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!