Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tables
IECON Proceedings (Industrial Electronics Conference)
Saved in:
Main Authors: | Ramkumar, K.B., Druckenmueller, M., Xi, Y.X., Philips, P., Presig, H.A., Ho, W.K., Lim, K.W. |
---|---|
其他作者: | ELECTRICAL ENGINEERING |
格式: | Conference or Workshop Item |
出版: |
2014
|
在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/72636 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | National University of Singapore |
相似書籍
-
Structured fault-detection and diagnosis using finite-state automaton
由: Ramkumar, K.B., et al.
出版: (2014) -
Fault diagnosis using dynamic finite-state automaton models
由: Xi, Y.-X., et al.
出版: (2014) -
Automaton-based fault detection and isolation
由: Philips, P., et al.
出版: (2014) -
Diagnosability of faults using finite-state automaton model
由: Xi, YunXia, et al.
出版: (2014) -
Integrated fault diagnosis scheme using finite-state automation
由: XI YUNXIA
出版: (2010)