Diagnosability of faults using finite-state automaton model

IEEE Region 10 Annual International Conference, Proceedings/TENCON

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書目詳細資料
Main Authors: Xi, YunXia, Lim, Khiang-Wee, Ho, Weng-Khuen, Preisig, Heinz A.
其他作者: ELECTRICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/72577
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