Structured fault-detection and diagnosis using finite-state automaton
IECON Proceedings (Industrial Electronics Conference)
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Main Authors: | Ramkumar, K.B., Philips, Patrick, Presig, Heinz A., Ho, W.K., Lim, K.W. |
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其他作者: | ELECTRICAL ENGINEERING |
格式: | Review |
出版: |
2014
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在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/68428 |
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機構: | National University of Singapore |
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