Reduction of charging effects using vector scanning in the scanning electron microscope

Reduction of charging effects using vector scanning in the scanning electron microscope

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書目詳細資料
Main Authors:	Thong, J.T.L., Lee, K.W., Wong, W.K.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Article
出版:	2014
主題:	Raster scan Scanning electron microscopy Specimen charging Vector scanning
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/57224
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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