APA Citation

Thong, J., Lee, K., Wong, W., & ENGINEERING, E. &. C. (2014). Reduction of charging effects using vector scanning in the scanning electron microscope.

Chicago Style Citation

Thong, J.T.L., K.W Lee, W.K Wong, and ELECTRICAL & COMPUTER ENGINEERING. Reduction of Charging Effects Using Vector Scanning in the Scanning Electron Microscope. 2014.

MLA Citation

Thong, J.T.L., K.W Lee, W.K Wong, and ELECTRICAL & COMPUTER ENGINEERING. Reduction of Charging Effects Using Vector Scanning in the Scanning Electron Microscope. 2014.

Warning: These citations may not always be 100% accurate.