A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices

• Main Authors: Ooi, B.L., Chen, B., Lin, F., Kooi, P.S., Hui, C.S.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Bipolar transistor; HBT; Parameter extraction; Thermal resistance
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/54127
• 機構: National University of Singapore

10.1002/mop.10648