Performance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlation
A new technique for estimation of signal-to-noise ratio in scanning electron microscope images is reported. The method is based on the image noise cross-correlation estimation model recently developed. We derive the basic performance limits on a single image signal-to-noise ratio estimation using th...
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Main Authors: | LIM, W.K., Nia, M. E., Tso, Chih Ping., Sim, K. S. |
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其他作者: | School of Mechanical and Aerospace Engineering |
格式: | Article |
語言: | English |
出版: |
2013
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/85648 http://hdl.handle.net/10220/18084 |
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機構: | Nanyang Technological University |
語言: | English |
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