Performance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlation

• المؤلفون الرئيسيون: LIM, W.K., Nia, M. E., Tso, Chih Ping., Sim, K. S.
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Mechanical engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/85648; http://hdl.handle.net/10220/18084

A new technique for estimation of signal-to-noise ratio in scanning electron microscope images is reported. The method is based on the image noise cross-correlation estimation model recently developed. We derive the basic performance limits on a single image signal-to-noise ratio estimation using th...