Deep transfer metric learning

• المؤلفون الرئيسيون: Hu, Junlin, Lu, Jiwen, Tan, Yap Peng
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2016
• الموضوعات: Face; Face recognition; Learning systems; Machine learning; Training; Visualization; Measurement
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/80552; http://hdl.handle.net/10220/40552

Conventional metric learning methods usually assume that the training and test samples are captured in similar scenarios so that their distributions are assumed to be the same. This assumption doesn't hold in many real visual recognition applications, especially when samples are captured across...