Optional layout of input / output protection devices

This project was initiated for the effective design and layout of input protection devices. Scope of this work includes setting up prototype ESD testing environment, studying the layout of commercial chips and the ESD threshold voltages, then test our own design on the chip fabricated.

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書目詳細資料
Main Authors: Liu, Po Ching., Siek, Liter.
其他作者: School of Electrical and Electronic Engineering
格式: Research Report
出版: 2008
主題:
在線閱讀:http://hdl.handle.net/10356/2717
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機構: Nanyang Technological University