Analog smart I/O pads

• 主要作者: Tan, Shyue Mei.
• 其他作者: Chan Pak Kwong
• 格式: Final Year Project
• 語言: English
• 出版: 2009
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• 在線閱讀: http://hdl.handle.net/10356/16924
• 機構: Nanyang Technological University

Electrostatic discharge (ESD) is one of the leading causes of microchip failure during manufacture as well as field and consumer use [National Semiconductor Corporation]. ESD is an increasingly significant problem in integrated circuit design as increasing pin counts and faster circuit speeds compou...