Avoiding abnormal grain growth when annealing selective laser melted pure titanium by promoting nucleation

• المؤلفون الرئيسيون: Chen, Kewei, Huang, De Jun, Li, Hua, Jia, Ning, Chong, Warren
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2022
• الموضوعات: Engineering::Mechanical engineering; Engineering::Materials; Grain Refining; Electron Backscattering Diffraction
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/162543
• المؤسسة: Nanyang Technological University

In this study, the recrystallization process of selective laser melted (SLM) commercially pure titanium (CP-Ti) was followed by a quasi-in-situ electron backscatter diffraction (EBSD) method at 800 °C and 700 °C. Abnormal grain growth (AGG) initially emerges at the beginning of annealing at 800 °C a...