การลดความเค้นของอุปกรณ์ในบัลลาสต์อิเล็กทรอนิกส์
This thesis presents a study of device stress is in electronic ballasts. Circuit operations under different environment conditions and circuit designs were analyzed to identify the origins of the stress in high frequency electronic ballasts. Because some of the circuit components in the lamp ballast...
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格式: | Theses and Dissertations |
語言: | Thai |
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จุฬาลงกรณ์มหาวิทยาลัย
2000
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在線閱讀: | https://digiverse.chula.ac.th/Info/item/dc:47055 |
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機構: | Chulalongkorn University |
語言: | Thai |
總結: | This thesis presents a study of device stress is in electronic ballasts. Circuit operations under different environment conditions and circuit designs were analyzed to identify the origins of the stress in high frequency electronic ballasts. Because some of the circuit components in the lamp ballast system and their operation are nonlinear, exact circuit analysis and design could hardly be done. Fundamental frequency approximation analytical technique, linear lamp model, as well as graphical technique, were used to establish the circuit equations. Two main catagories of device stress were studied: stresses occuring during lamp ignition and stresses stimulated by both the input voltage variation and the lamp equivalent resistance change. Stress reduction techniques for each type of stress were proposed and verified experimentally. |
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