Statistical characterization and reliability modeling of novel high-K gate dielectric stacks

by Nagarajan Raghavan
Published 2012

SIMULATION OF COPPER ELECTRODEPOSITION FOR HIGH ASPECT RATIO THROUGH- SILICON VIA APPLICATIONS IN THREE- DIMENSIONAL INTEGRATED CIRCUITS

by NAGARAJAN RAGHAVAN
Published 2019

Hardware implementation of memristor-based artificial neural networks

by Fernando Aguirre, Abu Sebastian, Manuel Le Gallo, Wenhao Song, Tong Wang, J. Joshua Yang, Wei Lu, Meng-Fan Chang, Daniele Ielmini, Yuchao Yang, Adnan Mehonic, Anthony Kenyon, Marco A. Villena, Juan B. Roldán, Yuting Wu, Hung-Hsi Hsu, Nagarajan Raghavan, Jordi Suñé, Enrique Miranda, Ahmed Eltawil, Gianluca Setti, Kamilya Smagulova, Khaled N. Salama, Olga Krestinskaya, Xiaobing Yan, Kah Wee Ang, Samarth Jain, Sifan Li, Osamah Alharbi, Sebastian Pazos, Mario Lanza
Published 2024