De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices

بواسطة Loo, Xi Sung.
منشور في 2012

A new unified model for channel thermal noise of deep sub-micron RFCMOS

بواسطة Ong, Shih Ni, Yeo, Kiat Seng, Chan, Lye Hock, Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh, Chew, Kok Wai Johnny
منشور في 2010

High frequency drain current noise modeling in MOSFETs under sub-threshold condition

بواسطة Chan, Lye Hock, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Ong, Shih Ni, Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
منشور في 2010

Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs

بواسطة Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, Lye Hock, Loo, Xi Sung, Do, Manh Anh, Boon, Chirn Chye
منشور في 2010

A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS

بواسطة Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
منشور في 2013

MOSFET drain current noise modeling with effective gate overdrive and junction noise

بواسطة Chan, L. H. K., Yeo, Kiat Seng, Chew, Kok Wai Johnny, Ong, Shih Ni, Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
منشور في 2013

Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs

بواسطة Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
منشور في 2013

A new millimeter-wave fixture deembedding method based on generalized cascade network model

بواسطة Loo, Xi Sung, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Ong, Shih Ni, Do, Manh Anh, Boon, Chirn Chye
منشور في 2013