Tunable stress and controlled thickness modification in graphene by annealing

by Ni, Z.H., Wang, H.M., Ma, Y., Kasim, J., Wu, Y.H., Shen, Z.X.
Published 2014

Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

by Ni, Zhenhua, Lee, Pooi See, Shen, Zexiang, Kasim, J., Tee, X. Y., You, Y. M., Setiawan, Y., Chan, L.
Published 2012

High pressure photoluminescence and Raman studies of ZnxCd 1-xSe quantum dots

by Ni, Z.H., Fan, H.M., Kasim, J., You, Y.M., Feng, Y.P., Han, M.Y., Shen, Z.X.
Published 2014

Graphene thickness determination using reflection and contrast spectroscopy

by Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X.
Published 2014