Tunable stress and controlled thickness modification in graphene by annealing

بواسطة Ni, Z.H., Wang, H.M., Ma, Y., Kasim, J., Wu, Y.H., Shen, Z.X.
منشور في 2014

Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

بواسطة Ni, Zhenhua, Lee, Pooi See, Shen, Zexiang, Kasim, J., Tee, X. Y., You, Y. M., Setiawan, Y., Chan, L.
منشور في 2012

High pressure photoluminescence and Raman studies of ZnxCd 1-xSe quantum dots

بواسطة Ni, Z.H., Fan, H.M., Kasim, J., You, Y.M., Feng, Y.P., Han, M.Y., Shen, Z.X.
منشور في 2014

Graphene thickness determination using reflection and contrast spectroscopy

بواسطة Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X.
منشور في 2014