Teo, E., Mangaiyarkarasi, D., Breese, M., Bettiol, A., Blackwood, D., & PHYSICS. (2014). Controlled intensity emission from patterned porous silicon using focused proton beam irradiation.
استشهاد بنمط شيكاغوTeo, E.J., D. Mangaiyarkarasi, M.B.H Breese, A.A Bettiol, D.J Blackwood, و PHYSICS. Controlled Intensity Emission From Patterned Porous Silicon Using Focused Proton Beam Irradiation. 2014.
MLA استشهادTeo, E.J., et al. Controlled Intensity Emission From Patterned Porous Silicon Using Focused Proton Beam Irradiation. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.