Preparation of cantilevered W tips for atomic force microscopy and apertureless near-field scanning optical microscopy
10.1063/1.1494867
Saved in:
Main Authors: | Sun, W.X., Shen, Z.X., Cheong, F.C., Yu, G.Y., Lim, K.Y., Lin, J.Y. |
---|---|
其他作者: | PHYSICS |
格式: | Article |
出版: |
2014
|
在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/97589 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Near-field scanning Raman microscopy using apertureless probes
由: Sun, W.X., et al.
出版: (2014) -
Apertureless near-field scanning Raman microscopy using reflection scattering geometry
由: Sun, W.X., et al.
出版: (2014) -
Apertureless near-field scanning raman microscopy using reflection scattering geometry
由: SHEN, ZE XIANG, et al.
出版: (2012) -
APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
由: SHEN, ZE XIANG, et al.
出版: (2012) -
APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
由: SHEN, ZE XIANG, et al.
出版: (2012)