Teo, K., Qin, L., Shen, Z., Schmidt, O., & ENGINEERING, E. &. C. (2014). Pressure-induced resonant Raman scattering in Ge/Si islands.
استشهاد بنمط شيكاغوTeo, K.L., L. Qin, Z.X Shen, O.G Schmidt, و ELECTRICAL & COMPUTER ENGINEERING. Pressure-induced Resonant Raman Scattering in Ge/Si Islands. 2014.
MLA استشهادTeo, K.L., et al. Pressure-induced Resonant Raman Scattering in Ge/Si Islands. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.