Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction

Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction

10.1109/ICSMC.2008.4811434

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書目詳細資料
Main Authors:	Shao, S.-Y., Shen, K.-Q., Ong, C.-J., Li, X.-P., Wilder-Smith, E.P.V.
其他作者:	MECHANICAL ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
主題:	Artifact removal Electroencephalogram Error correction Support vector machine
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/73208
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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