Tan, S., Tjhung, T., & ENGINEERING, E. (2014). Error probability of M-ary DPSK in fast Rician fading and lognormal shadowing.
استشهاد بنمط شيكاغوTan, S.H., T.T Tjhung, و ELECTRICAL ENGINEERING. Error Probability of M-ary DPSK in Fast Rician Fading and Lognormal Shadowing. 2014.
MLA استشهادTan, S.H., T.T Tjhung, و ELECTRICAL ENGINEERING. Error Probability of M-ary DPSK in Fast Rician Fading and Lognormal Shadowing. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.