Dai, L., Tan, V., Yang, S., Wu, P., Chen, X., & ENGINEERING, M. (2014). Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations.
استشهاد بنمط شيكاغوDai, L., V.B.C Tan, S.-W Yang, P. Wu, X.-T Chen, و MECHANICAL ENGINEERING. Understanding Nitrogen-induced Effects On the Performance of Ultra Low-k Dielectric Systems Through Ab Initio Simulations. 2014.
MLA استشهادDai, L., et al. Understanding Nitrogen-induced Effects On the Performance of Ultra Low-k Dielectric Systems Through Ab Initio Simulations. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.