APA استشهاد

Zhu, M., Chin, H., Tung, C., Yeo, Y., & ENGINEERING, E. &. C. (2014). In situ silane passivation of gallium arsenide and deposition of high-permittivity gate dielectric for MOS applications.

استشهاد بنمط شيكاغو

Zhu, M., H.-C Chin, C.-H Tung, Y.-C Yeo, و ELECTRICAL & COMPUTER ENGINEERING. In Situ Silane Passivation of Gallium Arsenide and Deposition of High-permittivity Gate Dielectric for MOS Applications. 2014.

MLA استشهاد

Zhu, M., et al. In Situ Silane Passivation of Gallium Arsenide and Deposition of High-permittivity Gate Dielectric for MOS Applications. 2014.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.