Zhu, M., Chin, H., Tung, C., Yeo, Y., & ENGINEERING, E. &. C. (2014). In situ silane passivation of gallium arsenide and deposition of high-permittivity gate dielectric for MOS applications.
Chicago Style CitationZhu, M., H.-C Chin, C.-H Tung, Y.-C Yeo, and ELECTRICAL & COMPUTER ENGINEERING. In Situ Silane Passivation of Gallium Arsenide and Deposition of High-permittivity Gate Dielectric for MOS Applications. 2014.
MLA引文Zhu, M., et al. In Situ Silane Passivation of Gallium Arsenide and Deposition of High-permittivity Gate Dielectric for MOS Applications. 2014.
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