SHURUI, W., & ENGINEERING, E. &. C. (2010). Tip sharpened methods for atomic force microscopy.
استشهاد بنمط شيكاغوSHURUI, WANG, و ELECTRICAL & COMPUTER ENGINEERING. Tip Sharpened Methods for Atomic Force Microscopy. 2010.
MLA استشهادSHURUI, WANG, و ELECTRICAL & COMPUTER ENGINEERING. Tip Sharpened Methods for Atomic Force Microscopy. 2010.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.