APA引文

Yin, W., Dong, X., & LABORATORIES, T. (2014). The attenuation and slow-wave characteristics of an inverted embedded (IEM) metal-insulator semiconductor (MIS) microstrip line.

Chicago Style Citation

Yin, W.Y., X.T Dong, and TEMASEK LABORATORIES. The Attenuation and Slow-wave Characteristics of an Inverted Embedded (IEM) Metal-insulator Semiconductor (MIS) Microstrip Line. 2014.

MLA引文

Yin, W.Y., X.T Dong, and TEMASEK LABORATORIES. The Attenuation and Slow-wave Characteristics of an Inverted Embedded (IEM) Metal-insulator Semiconductor (MIS) Microstrip Line. 2014.

警告：這些引文格式不一定是100％准確.