The effect of intrinsic defects on resistive switching based on p-n heterojunction

10.1109/INEC.2013.6466003

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書目詳細資料
Main Authors: Zheng, K., Sun, X.W., Teo, K.L.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/114588
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機構: National University of Singapore